The Gaertner Scientific LS116S300 Ellipsometer operates with a HeNe laser (632.8 nm wavelength), and is typically used in our group to measure the thickness of spin-coated or flowcoated polymer films on Si wafer substrates.  The ellipsometer is also equipped with an INSTEC HCS302 hot stage, with mK1000 Controller, which permits operation above or below room temperature, as well as scanning operation to measure thermal transitions in supported polymer thin films.